Introducing New Software EDM 5.1

The new Engineering Data Management software release from Crystal Instruments, EDM 5.1, improves ease of use, performance, and scalability of the associated hardware.

The updated software version, introduced approximately 7 months from the previous 5.0 release, features enhancements to the high channel count configuration, as well as Multi-Sine control, Multi-exciter single-control for Sine, Fatigue Damage Spectrum (FDS) in Random, and Transient Random control. The release also supports the brand-new handheld dynamic signal analyzer, Spider-20.

EDM 5.1 has expanded the scalability of the high channel count system. The Crystal Instruments Spider system supports over 256 channels when operating dynamic signal analysis (DSA) and Vibration Control (VCS) tests. The performance and stability of high channel count system tests have also been enhanced in this release.

For the first time ever, EDM offers Multi-Sine Control. This function enables multiple Sine tones sweeping simultaneously and ensures that multiple resonant frequencies of the structure can be excited. With multiple Sine tone excitation, the required time duration of the sine testing is reduced significantly. 

The multi-excited single control for Sine enables the system to output up to four Sine drive signals that can run up to four shakers at the same time. The phase difference between each drive and control signal is calculated and controlled during real-time operation. 

Fatigue Damage Spectrum (FDS) allows users to compare the potential damage caused by different Random and swept Sine profiles.  In a similar fashion to Multi-Sine Control, FDS provides a way to reduce testing times by calculating the quickest path to destruction or damage.  Testing times are accelerated by focusing random or swept Sine energy, depending on the FDS calculation, to where it will induce the most fatigue.

Transient Random control applies a chain of pulses, random in nature, to the shaker. The target profile power spectrum is defined in the same way as Random control, with the addition of defining a transient pulse interval. Applications include the simulation of gunfire or road travel.

EDM features supported by Spider-20 include:

  • FFT
  • Octave analysis and Sound Level Meter
  • Order analysis
  • Swept Sine analysis
  • Sine Reduction
  • Time waveform recording
  • Automated schedule and limiting
  • Real-time digital filters
  • SRS analysis

Crystal Instruments’ consistent software updates, bug fixes, and feature additions result in both the development of new hardware and in expanded capability of existing hardware.

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