Crystal Instruments Announces Issuance of U.S. Patent for Breakthrough Dual-ADC Data Recording Architecture
Santa Clara, CA - November 25, 2025 — Crystal Instruments Corporation, a global leader in vibration testing, dynamic measurement, and data acquisition technologies, today announced that the United States Patent and Trademark Office has officially granted U.S. Patent No. 12,483,216 B2, titled “Data Recording Based on Dual ADC Architecture.” The patent is credited to inventor James Q. Zhuge, founder and CEO of Crystal Instruments.
This newly issued patent represents a significant advancement in precision data acquisition, introducing a novel dual-ADC (analog-to-digital converter) measurement architecture that enables exceptionally high dynamic range (up to 175 dBFS), improved signal fidelity, and superior handling of transient events across a wide spectrum of physical measurements.
A Major Advancement Beyond Traditional “Stitching” Technologies
Crystal Instruments previously pioneered the industry-leading stitching method described in U.S. Patent 7,302,354, which recombined high-gain and low-gain ADC streams into a single calibrated signal. While ideal for stable signals, classical stitching presented challenges when capturing fast transients or signals that change amplitude abruptly.
The new patent introduces a breakthrough solution:
Instead of stitching two ADC streams together, both calibrated streams are recorded independently.
This preserves full signal integrity and eliminates stitching artifacts during dynamic transitions.
Key innovations include:
Dual, Simultaneous ADC Paths
A higher-gain, small-range ADC for superior noise performance.
A lower-gain, large-range ADC for capturing large-amplitude signals without clipping.
Intelligent Post-Recording Selection of the Optimal Signal
After a full event is recorded, the system evaluates the data for clipping using total harmonic distortion (THD) and automatically selects the best ADC path for analysis.
If no clipping is detected: use the high-gain data for best SNR.
If clipping occurred: use the large-range data.
Cross-Channel Calibration for Signal Precision
The patent introduces a unique calibration method performed between the two ADC paths, ensuring perfect alignment during post-processing.
Pre-Trigger & Post-Trigger Circular Buffer Recording
A sophisticated state machine and circular buffer allow the system to store:
Pre-trigger data (x seconds prior to the event)
Post-trigger data (y seconds afterward)
This ensures complete capture of transient events such as machinery faults, shock impulses, gunshots, sonic booms, or earthquakes.
Enhanced Capability for Modern Dynamic Measurement Applications
The patented technology enables:
Automatic “no-range-setting” operation for simplified user experience
Dramatically improved transient capture accuracy
Superior high-dynamic-range results without signal reconstruction artifacts
Simultaneous recording of both large-range and small-range data
Scalability across multi-channel systems (4, 8, 16 channels or more)
This innovation is especially beneficial in:
Vibration and shock testing
Machine condition monitoring
Seismic and acoustic measurements
Aerospace and defense instrumentation
Any application requiring reliable capture of unpredictable or high-speed dynamic events
Statement from James Q. Zhuge, Inventor and CEO
“This patent reflects Crystal Instruments’ continued commitment to pushing the boundaries of dynamic measurement technology. By eliminating stitching artifacts and enabling precise transient capture, this new dual-ADC architecture allows engineers, researchers, and test professionals to obtain cleaner, more reliable data than ever before. It is a major step forward for the entire industry. Crystal Instruments first successfully applied this patented technology in a NASA project for measuring the sound boom of its X-59 supersonic aircraft.”
About Crystal Instruments
Crystal Instruments (CI), headquartered in Santa Clara, California, is a world leader in vibration control systems, data acquisition, dynamic signal analysis, and machine condition monitoring. CI designs and manufactures advanced hardware and software solutions used in aerospace, automotive, electronics, industrial machinery, and research laboratories worldwide.
Media Contact
Crystal Instruments Corporation
Marketing & Communications
Email: info@go-ci.com
Phone: (408) 986-8880
Website: www.crystalinstruments.com